PHIL Testing Experience at KIT: Experimental Validations of New Technologies
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Autor:
Hubschneider, S.; Waczowicz, S.; Wiegel, F.; Karrari, S.; de Sousa, W. T. B.; De Carne, G.; Geisbüsch, J.; Hiller, M.; Leibfried, T.; Hagenmeyer, V.; Noe, M.
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Quelle:
RT20, Opal-RT's 12th COnference on Real-Time Simulation
- Datum: 06/2020