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Dielectric Frequency Measurement of Semiconductive Layers in Xlpe Cables

Dielectric Frequency Measurement of Semiconductive Layers in Xlpe Cables
Autor:

T. Maier, K. Schmehl and T. Leibfried

Quelle:

2018 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP), Cancun, Mexico, October 2018

Datum: 2018