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FREQUENCY MEASUREMENT OF THE DIELECTRIC PROPERTIES OF SEMICONDUCTIVE LAYERS IN XLPE-CABLES

FREQUENCY MEASUREMENT OF THE DIELECTRIC PROPERTIES OF SEMICONDUCTIVE LAYERS IN XLPE-CABLES
Autor:

T. Maier und T. Leibfried

Quelle:

2017 IEEE CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA (CEIDP),
Fort Worth, TX, USA

Datum: October 2017